Use of the LRU stack depth distribution for simulation of paging behavior

Two families of probability distributions were needed for use by a virtual memory simulation model: headway between page fault distributions, and working set size distributions. All members of both families can be derived from the LRU stack depth distribution. Simple expressions for the computation of both kinds of distributions are given. Finally, examples are given of both families of distributions as computed from a published stack depth distribution.

View this article in the ACM Digital Library.