Researchers at the University of Tokyo's Institute of Industrial Science in Japan have developed an artificial intelligence (AI) system that can quickly find and label two-dimensional (2D) materials in microscope images.
The team used many labeled examples of 2D materials with various lighting to train the machine learning program to detect the outline and thickness of crystallized flakes without having to fine-tune the microscope parameters.
The researchers found that the systems can determine, in less than 200 milliseconds, the location and thickness of the exfoliated samples.
Said University of Tokyo researcher Tomoki Machida, "The automated searching and cataloging of 2D materials will allow researchers to test a large number of samples simply by exfoliating and running the automated algorithm."
From Institute of Industrial Science, the University of Tokyo
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