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Home/Magazine Archive/August 2009 (Vol. 52, No. 8)/Statistical Analysis of Circuit Timing Using Majorization/Abstract

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Statistical Analysis of Circuit Timing Using Majorization

By Michael Orshansky, Wei-Shen Wang
Communications of the ACM, August 2009, Vol. 52 No. 8, Pages 95-100
10.1145/1536616.1536641
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distribution of dopant atoms in a transistor — Distribution of dopant atoms in a transistor with the length of 50 nm. The number and location of atoms determine the key electrical properties.

Reprinted from Berstein et al. IBM, 2006

Future miniaturization of silicon transistors following Moore's Law may be in jeopardy as it becomes harder to precisely define the behavior and shape of nanoscale transistors.

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